Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor Memory | |
Liu, P; Wu, JG; You, ZQ; Elimu, M; Wang, WZ; Cai, S; IEEE | |
会议名称 | 27th IEEE Asian Test Symposium, ATS 2018 |
会议日期 | 2018 |
会议地点 | Hefei, China |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5452219 |
专题 | 湖南大学 |
作者单位 | 1.Guangdong Univ Technol, Sch Comp, Guangzhou, Guangdong, Peoples R China 2.Hunan Univ, Coll Comp Sci & Elect Engn, Changsha, Hunan, Peoples R China 3.Changsha Univ Sci & Technol, Coll Comp & Commun Engn, Changsha, Hunan, Peoples R China |
推荐引用方式 GB/T 7714 | Liu, P,Wu, JG,You, ZQ,et al. Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor Memory[C]. 见:27th IEEE Asian Test Symposium, ATS 2018. Hefei, China. 2018. |
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