Automatic defect-detection for inside and outside surfaces of hemispherical shell | |
Le, J; Guo, JJ; Zhu, H; Fang, HY; Wang, W; He, JD; Zhang, ZX | |
2002 | |
会议名称 | International Symposium on Precision Mechanical Measurements |
会议日期 | 2002-08-11 |
会议地点 | HEFEI, PEOPLES R CHINA |
关键词 | hemispherical shell surface defect image measurement measurement method specular surfaces |
页码 | 79-85 |
会议录 | PROCEEDINGS OF THE INTERNATIONAL SYMPOSIUM ON PREC
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URL标识 | 查看原文 |
WOS记录号 | WOS:000180755900018 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5442692 |
专题 | 西安理工大学 |
推荐引用方式 GB/T 7714 | Le, J,Guo, JJ,Zhu, H,et al. Automatic defect-detection for inside and outside surfaces of hemispherical shell[C]. 见:International Symposium on Precision Mechanical Measurements. HEFEI, PEOPLES R CHINA. 2002-08-11. |
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