Automated seeded region growing method for document image binarization based on topographic features
Sun, YF; Chen, Y; Zhang, YZ; Li, YX
刊名IMAGE ANALYSIS AND RECOGNITION, PT 2, PROCEEDINGS
2004
卷号3212页码:200-208
ISSN号0302-9743
英文摘要Binarization of document images with poor contrast, high noise and variable modalities remains a challenging problem. This paper proposes a new binarization method that adopts the use of seeded region growing and character's topographic feature. It consists of three steps: first, seed pixels are selected automatically according to their topographic features; second, regions are grown controlled by new weighted priority until all pixels are labeled black or white; third, noisy regions are removed based on the average stroke width feature. Our method overcomes the difficulty of global binarization to find a single value to fit all. It also avoids the common problem in most local thresholding technique of finding a suitable window size. The proposed method performed well in binarization and the experimental results of evaluation showed significant improvement compared to several other methods.
WOS研究方向Computer Science ; Imaging Science & Photographic Technology
语种英语
出版者SPRINGER-VERLAG BERLIN
WOS记录号WOS:000224317200025
内容类型期刊论文
源URL[http://119.78.100.204/handle/2XEOYT63/13820]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Sun, YF
作者单位1.Chinese Acad Sci, Comp Technol Inst, Beijing 100080, Peoples R China
2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China
推荐引用方式
GB/T 7714
Sun, YF,Chen, Y,Zhang, YZ,et al. Automated seeded region growing method for document image binarization based on topographic features[J]. IMAGE ANALYSIS AND RECOGNITION, PT 2, PROCEEDINGS,2004,3212:200-208.
APA Sun, YF,Chen, Y,Zhang, YZ,&Li, YX.(2004).Automated seeded region growing method for document image binarization based on topographic features.IMAGE ANALYSIS AND RECOGNITION, PT 2, PROCEEDINGS,3212,200-208.
MLA Sun, YF,et al."Automated seeded region growing method for document image binarization based on topographic features".IMAGE ANALYSIS AND RECOGNITION, PT 2, PROCEEDINGS 3212(2004):200-208.
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