A Scalable Kernel-Based Semisupervised Metric Learning Algorithm with Out-of-Sample Generalization Ability

CORC > 计算技术研究所 > 中国科学院计算技术研究所 > 中国科学院计算技术研究所期刊论文 > 英文

	A Scalable Kernel-Based Semisupervised Metric Learning Algorithm with Out-of-Sample Generalization Ability
	Yeung, Dit-Yan 1; Chang, Hong 2; Dai, Guang 1
刊名	NEURAL COMPUTATION
	2008-11-01
卷号	20 期号:11 页码:2839-2861
ISSN号	0899-7667
英文摘要	In recent years, metric learning in the semisupervised setting has aroused a lot of research interest. One type of semisupervised metric learning utilizes supervisory information in the form of pairwise similarity or dissimilarity constraints. However, most methods proposed so far are either limited to linear metric teaming or unable to scale well with the data set size. In this letter, we propose a nonlinear metric learning method based on the kernel approach.-By applying low-rank approximation to the kernel matrix, our method can handle significantly larger data sets. Moreover, our low-rank approximation scheme can naturally lead to out-of-sample generalization. Experiments performed on both artificial and real-world data show very promising results.
资助项目	Council of the Hong Kong Special Administrative Region, China[621706]
WOS研究方向	Computer Science
语种	英语
出版者	M I T PRESS
WOS记录号	WOS:000260113500010
内容类型	期刊论文
源URL	[http://119.78.100.204/handle/2XEOYT63/11151]
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Yeung, Dit-Yan
作者单位	1.Hong Kong Univ Sci & Technol, Dept Comp Sci & Engn, Hong Kong, Hong Kong, Peoples R China 2.Chinese Acad Sci, Inst Comp Technol, Key Lab Intelligent Informat Proc, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Yeung, Dit-Yan,Chang, Hong,Dai, Guang. A Scalable Kernel-Based Semisupervised Metric Learning Algorithm with Out-of-Sample Generalization Ability[J]. NEURAL COMPUTATION,2008,20(11):2839-2861.
APA	Yeung, Dit-Yan,Chang, Hong,&Dai, Guang.(2008).A Scalable Kernel-Based Semisupervised Metric Learning Algorithm with Out-of-Sample Generalization Ability.NEURAL COMPUTATION,20(11),2839-2861.
MLA	Yeung, Dit-Yan,et al."A Scalable Kernel-Based Semisupervised Metric Learning Algorithm with Out-of-Sample Generalization Ability".NEURAL COMPUTATION 20.11(2008):2839-2861.