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	Electric Control of Friction on Silicon Studied by Atomic Force Microscope
	Jiang, Yan[1]; Yue, Lili[2]; Yan, Boshen[3]; Liu, Xi[4]; Yang, Xiaofei[5]; Tai, Guoan[6]; Song, Juan[7]
刊名	NANO
	2015
卷号	10期号:3
关键词	Friction electric field silicon atomic force microscope
ISSN号	1793-2920
DOI	http://dx.doi.org/10.1142/S1793292015500381
URL标识	查看原文
收录类别	SCI(E) ; EI
WOS记录号	WOS:000356065600007
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5393918
专题	江苏大学
作者单位	[1]School of Material Science and Engineering, Jiangsu University, Zhenjiang, China [2]School of Medicine, Henan University of Traditional Chinese Medicine, Zhengzhou, China [3]School of Material Science and Engineering, Jiangsu University, Zhenjiang, China [4]School of Material Science and Engineering, Jiangsu University, Zhenjiang, China [5]School of Material Science and Engineering, Jiangsu University, Zhenjiang, China [6]Key Laboratory for Intelligent Nano Materials and Devices, Institute of Nanoscience, Nanjing University of Aeronautics and Astronautics, Nanjing, China[7]School of Material Science and Engineering, Jiangsu University, Zhenjiang, China
推荐引用方式 GB/T 7714	Jiang, Yan[1],Yue, Lili[2],Yan, Boshen[3],et al. Electric Control of Friction on Silicon Studied by Atomic Force Microscope[J]. NANO,2015,10(3).
APA	Jiang, Yan[1].,Yue, Lili[2].,Yan, Boshen[3].,Liu, Xi[4].,Yang, Xiaofei[5].,...&Song, Juan[7].(2015).Electric Control of Friction on Silicon Studied by Atomic Force Microscope.NANO,10(3).
MLA	Jiang, Yan[1],et al."Electric Control of Friction on Silicon Studied by Atomic Force Microscope".NANO 10.3(2015).

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