Contact dynamics of tapping mode atomic force microscopy

CORC > 力学研究所 > 中国科学院力学研究所 > 非线性力学国家重点实验室

	Contact dynamics of tapping mode atomic force microscopy
	Zhang Y(张吟); Zhao HS(赵海盛); Zhuo LJ(卓立军); Zhang, Y
刊名	JOURNAL OF SOUND AND VIBRATION
	2012-11-05
通讯作者邮箱	zhangyin@lnm.imech.ac.cn
卷号	331 期号:23 页码:5141-5152
关键词	Tip-Sample Interaction Frequency-Shifts Higher-Harmonics Spectroscopy Modulation Resolution Oscillator Friction Contrast Behavior
ISSN号	0022-460X
通讯作者	Zhang, Y ; Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China.
产权排序	[Zhang, Yin;Zhao, Haisheng; Zuo, Lijun] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China
中文摘要	A comprehensive model on the dynamics of a tilted tapping mode atomic force microscopy (AFM) is presented, which includes the multimodal analysis, mode coupling mechanisms, adhesion, contact and friction forces induced by the tilting angle. A displacement criterion of contact/impact is proposed to eliminate the assumptions of the previous models such as infinite stiffness of sample or zero impact velocity, which makes the model presented here suitable for more general AFM application scenario, especially for the soft sample case. The AFM tip mass, tip-sample damping, contact forces and intermittent contact can all induce the higher modes participation into the system motion. One degree of freedom or one mode study on the AFM contact dynamics of tapping mode is shown to be inaccurate. The Hertz and Derjaguin-Muller-Toporov models are used for the comparison study of the non-adhesive and adhesive contacts. The intermittent contact and the contact forces are the two major sources of the system nonlinearity. The rich dynamic responses of the system and its sensitivity to the initial conditions are demonstrated by presenting various subharmonic and nonperiodic motions.
学科主题	非线性振动与控制
分类号	二类
收录类别	SCI ; EI
资助信息	The research has been supported by the National Natural Science Foundation of China (NSFC Nos. 11021262 and 11023001) and Chinese Academy of Sciences (Grant no. KJCX2-EW-L03).
原文出处	http://dx.doi.org/10.1016/j.jsv.2012.07.014
语种	英语
WOS记录号	WOS:000308383000011
公开日期	2013-01-18
内容类型	期刊论文
源URL	[http://dspace.imech.ac.cn/handle/311007/46675]
专题	力学研究所_非线性力学国家重点实验室
通讯作者	Zhang, Y
推荐引用方式 GB/T 7714	Zhang Y,Zhao HS,Zhuo LJ,et al. Contact dynamics of tapping mode atomic force microscopy[J]. JOURNAL OF SOUND AND VIBRATION,2012,331(23):5141-5152.
APA	张吟,赵海盛,卓立军,&Zhang, Y.(2012).Contact dynamics of tapping mode atomic force microscopy.JOURNAL OF SOUND AND VIBRATION,331(23),5141-5152.
MLA	张吟,et al."Contact dynamics of tapping mode atomic force microscopy".JOURNAL OF SOUND AND VIBRATION 331.23(2012):5141-5152.