Automatic Wheat Leaf Rust Detection and Grading Diagnosis via Embedded Image Processing System | |
Xu, Peifeng[1]; Wu, Gangshan[2]; Guo, Yijia[3]; Chen, Xiaoyin[4]; Yang, Hetong[5]; Zhan, Rongbiao[6] | |
2017 | |
会议名称 | 7th International Congress of Information and Communication Technology (ICICT) |
会议日期 | 2017-01-01 |
关键词 | Wheat Leaf Rust image processing disease diagnosis Embedded system |
页码 | 836-841 |
收录类别 | EI ; CPCI-S |
URL标识 | 查看原文 |
WOS记录号 | WOS:000410922900134 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5349277 |
专题 | 江苏大学 |
作者单位 | 1.[1]Jiangsu Polytech Coll Agr & Forestry, Engn & Technol Ctr Mordern Hort, Jurong 212400, Peoples R China. 2.Jiangsu Univ, Sch Elect & Informat Engn, Zhenjiang 212013, Peoples R China. 3.[2]Jiangsu Polytech Coll Agr & Forestry, Engn & Technol Ctr Mordern Hort, Jurong 212400, Peoples R China. 4.[3]Jiangsu Univ, Sch Elect & Informat Engn, Zhenjiang 212013, Peoples R China. 5.[4]Jiangsu Polytech Coll Agr & Forestry, Engn & Technol Ctr Mordern Hort, Jurong 212400, Peoples R China. 6.[5]Jiangsu Polytech Coll Agr & Forestry, Engn & Technol Ctr Mordern Hort, Jurong 212400, Peoples R China. 7.[6]Jiangsu Univ, Sch Elect & Informat Engn, Zhenjiang 212013, Peoples R China. |
推荐引用方式 GB/T 7714 | Xu, Peifeng[1],Wu, Gangshan[2],Guo, Yijia[3],et al. Automatic Wheat Leaf Rust Detection and Grading Diagnosis via Embedded Image Processing System[C]. 见:7th International Congress of Information and Communication Technology (ICICT). 2017-01-01. |
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