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Material Removal Mechanism of Chemo-mechanical Grinding (CMG) of Si Wafer by Using Soft Abrasive Grinding Wheel (SAGW)
Guo, D. M.; Tian, Y. B.; Kang, R. K.; Zhou, L.; Lei, M. K.
2009
会议名称11th International Symposium on Advances in Abrasive Technology
会议日期2009-01-01
会议地点Awaji City, JAPAN
关键词Silicon wafers mechanism ultra-precision grinding CMG XPS SAGW
页码459-+
会议录11th International Symposium on Advances in Abrasive Technology
URL标识查看原文
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/5323803
专题大连理工大学
作者单位1.Dalian Univ Technol, Key Lab Precis & Nontradit Machining, Minist Educ, Dalian 116024, Peoples R China.
2.Dalian Univ Technol, Sch Mat Sci & Engn, Surface Engn Lab, Dalian 116024, Peoples R China.
3.Ibaraki Univ, Venture Business Lab VBL, Nakanarusawa, Hitachi 3168511, Japan.
4.Ibaraki Univ, Dept Inteiligent Syst Engn, Nakanarusawa, Hitachi 3168511, Japan.
5.Dalian Univ Technol, Sch Mat Sci & Engn, Surface Engn Lab, Dalian 116024, Peoples R China.
推荐引用方式
GB/T 7714
Guo, D. M.,Tian, Y. B.,Kang, R. K.,et al. Material Removal Mechanism of Chemo-mechanical Grinding (CMG) of Si Wafer by Using Soft Abrasive Grinding Wheel (SAGW)[C]. 见:11th International Symposium on Advances in Abrasive Technology. Awaji City, JAPAN. 2009-01-01.
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