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	Optical time domain reflectometry system at different wavelengths
	BELLER, JOSEF
	2008-08-12
著作权人	AGILENT TECHNOLOGIES, INC.
专利号	US7411666
国家	美国
文献子类	授权发明
其他题名	Optical time domain reflectometry system at different wavelengths
英文摘要	An optical time domain reflectometry system is used to determine a power response from a device under test -DUT-. For providing power information data, an optical transmitter launches a probe signal with a first wavelength into a DUT, an optical receiver determines optical power information of a first return signal returning from the DUT at a second wavelength, wherein the second wavelength is not equal to the first wavelength, and an analyzer analyzes the power information determined by the optical receiver, and generating data to be at least one of: visualized, stored, and further processed.
公开日期	2008-08-12
申请日期	2006-12-15
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/34507]
专题	半导体激光器专利数据库
作者单位	AGILENT TECHNOLOGIES, INC.
推荐引用方式 GB/T 7714	BELLER, JOSEF. Optical time domain reflectometry system at different wavelengths. US7411666. 2008-08-12.

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