| Monitor-detector assembly on silicon wafer board | |
| BOUDREAU, ROBERT A.; HAN, HONGTAO; ROFF, ROBERT WALLACE; WILSON, RANDALL BRIAN | |
| 1997-12-02 | |
| 著作权人 | THE WHITAKER CORPORATION |
| 专利号 | US5694048 |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Monitor-detector assembly on silicon wafer board |
| 英文摘要 | An optical subassembly for monitoring the emission of a semi-conductor laser is disclosed. The subassembly is diced from a wafer having mounted thereon the devices to be tested as well as the testing optical devices. The devices of the wafer are burned-in and those sections of the wafer having lasers that pass the burn-in testing are diced and form the subassemblies of the present invention. |
| 公开日期 | 1997-12-02 |
| 申请日期 | 1995-03-31 |
| 状态 | 失效 |
| 内容类型 | 专利 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/34441]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | THE WHITAKER CORPORATION |
| 推荐引用方式 GB/T 7714 | BOUDREAU, ROBERT A.,HAN, HONGTAO,ROFF, ROBERT WALLACE,et al. Monitor-detector assembly on silicon wafer board. US5694048. 1997-12-02. |
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