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	Methods of and apparatus for measuring picosecond semiconductor laser pulse duration using the internally generated second harmonic emission accompanying the laser output
	LIU, JIA M.; CHEN, YING C.
	1988-09-20
著作权人	GTE LABORATORIES INCORPORATED, A DE. CORP.
专利号	US4772118
国家	美国
文献子类	授权发明
其他题名	Methods of and apparatus for measuring picosecond semiconductor laser pulse duration using the internally generated second harmonic emission accompanying the laser output
英文摘要	The duration of a very short semiconductor laser pulse, such as that ranging from a fraction to hundreds to picoseconds, can be measured utilizing the internally generated second harmonic emission of the laser. A laser diode is driven so that light emitted therefrom can pass through a beam splitter and be reflected by the beam-splitter into a photomultiplier and into a detector, respectively. Signals received therefrom relate to the conversion efficiency of the second harmonic emission generated by the picosecond pulses and of either continuous wave emission or pulse emission whose durations can be accurately measured by photodetectors. Apparatus includes a photodiode for measuring the fundamental laser power, a photomultiplier for measuring the second harmonic power, and appropriate filters. Ammeters coupled to the photodiode and photomultiplier measure the appropriate current. The ratio of the current can be determined by a ratio circuit or a computer.
公开日期	1988-09-20
申请日期	1986-07-14
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/34403]
专题	半导体激光器专利数据库
作者单位	GTE LABORATORIES INCORPORATED, A DE. CORP.
推荐引用方式 GB/T 7714	LIU, JIA M.,CHEN, YING C.. Methods of and apparatus for measuring picosecond semiconductor laser pulse duration using the internally generated second harmonic emission accompanying the laser output. US4772118. 1988-09-20.

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