Backward P-reasoning and fault status identification-discovery in electronic system | |
Fan, Chengxian; Liu, Jiahe | |
刊名 | Lecture Notes in Electrical Engineering
![]() |
2013 | |
卷号 | 178 LNEE期号:VOL. 3页码:301-307 |
关键词 | backward P-reasoning elctronic system fault status identification-discovery |
DOI | 10.1007/978-3-642-31528-2_48 |
会议名称 | 2012 International Conference on Mechanical and Electronic Engineering, ICMEE 2012 |
URL标识 | 查看原文 |
会议日期 | 23 June 2012 through 24 June 2012 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5176015 |
专题 | 山东大学 |
作者单位 | 1.School of Electrical Engineering, Shandong University, Jinan, Shandong, 250061, China 2.School of Electrical Engineering |
推荐引用方式 GB/T 7714 | Fan, Chengxian,Liu, Jiahe. Backward P-reasoning and fault status identification-discovery in electronic system[J]. Lecture Notes in Electrical Engineering,2013,178 LNEE(VOL. 3):301-307. |
APA | Fan, Chengxian,&Liu, Jiahe.(2013).Backward P-reasoning and fault status identification-discovery in electronic system.Lecture Notes in Electrical Engineering,178 LNEE(VOL. 3),301-307. |
MLA | Fan, Chengxian,et al."Backward P-reasoning and fault status identification-discovery in electronic system".Lecture Notes in Electrical Engineering 178 LNEE.VOL. 3(2013):301-307. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论