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	Backward P-reasoning and fault status identification-discovery in electronic system
	Fan, Chengxian; Liu, Jiahe
刊名	Lecture Notes in Electrical Engineering
	2013
卷号	178 LNEE期号:VOL. 3页码:301-307
关键词	backward P-reasoning elctronic system fault status identification-discovery
DOI	10.1007/978-3-642-31528-2_48
会议名称	2012 International Conference on Mechanical and Electronic Engineering, ICMEE 2012
URL标识	查看原文
会议日期	23 June 2012 through 24 June 2012
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5176015
专题	山东大学
作者单位	1.School of Electrical Engineering, Shandong University, Jinan, Shandong, 250061, China 2.School of Electrical Engineering
推荐引用方式 GB/T 7714	Fan, Chengxian,Liu, Jiahe. Backward P-reasoning and fault status identification-discovery in electronic system[J]. Lecture Notes in Electrical Engineering,2013,178 LNEE(VOL. 3):301-307.
APA	Fan, Chengxian,&Liu, Jiahe.(2013).Backward P-reasoning and fault status identification-discovery in electronic system.Lecture Notes in Electrical Engineering,178 LNEE(VOL. 3),301-307.
MLA	Fan, Chengxian,et al."Backward P-reasoning and fault status identification-discovery in electronic system".Lecture Notes in Electrical Engineering 178 LNEE.VOL. 3(2013):301-307.

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