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	Thickness dependence of stress in La0.9Sr0.1MnO 3 monocrystalline nanofilms using synchrotron radiation X-ray diffraction
	Zhang H.-D.; Li Z.-J.; Long Y.-Z.; Xie H.-W.; Sun B.; Lu H.-B.; Mai Z.-H.
刊名	Journal of Crystal Growth
	2013
卷号	366页码:39-42
关键词	A1. Nanofilm A1. Residual stress A1. Synchrotron radiation X-ray diffraction B1. Perovskite oxide
DOI	10.1016/j.jcrysgro.2012.12.025
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5145551
专题	山东大学
作者单位	College of Physics, Qingdao University, Qingdao 266071, PR, China, Key Laboratory of Photonics Materials and Technology, Universities of
推荐引用方式 GB/T 7714	Zhang H.-D.,Li Z.-J.,Long Y.-Z.,et al. Thickness dependence of stress in La0.9Sr0.1MnO 3 monocrystalline nanofilms using synchrotron radiation X-ray diffraction[J]. Journal of Crystal Growth,2013,366:39-42.
APA	Zhang H.-D..,Li Z.-J..,Long Y.-Z..,Xie H.-W..,Sun B..,...&Mai Z.-H..(2013).Thickness dependence of stress in La0.9Sr0.1MnO 3 monocrystalline nanofilms using synchrotron radiation X-ray diffraction.Journal of Crystal Growth,366,39-42.
MLA	Zhang H.-D.,et al."Thickness dependence of stress in La0.9Sr0.1MnO 3 monocrystalline nanofilms using synchrotron radiation X-ray diffraction".Journal of Crystal Growth 366(2013):39-42.

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