Electron mobility of rare earth complexes measured by transient electroluminescence method

	Electron mobility of rare earth complexes measured by transient electroluminescence method
	Zang F. X. ; Lengyel O. ; Li W. L. ; Hong Z. R. ; Liu Z. ; Lee C. S. ; Lee S. T.
刊名	Solid-State Electronics
	2006
卷号	50 期号:9—10 页码:1584-1587
ISSN号	0038-1101
其他题名	论文其他题名
合作状况	合作性质
收录类别	SCI ; EI
语种	英语
公开日期	2012-10-21
内容类型	期刊论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/26733]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zang F. X.,Lengyel O.,Li W. L.,et al. Electron mobility of rare earth complexes measured by transient electroluminescence method[J]. Solid-State Electronics,2006,50(9—10):1584-1587.
APA	Zang F. X..,Lengyel O..,Li W. L..,Hong Z. R..,Liu Z..,...&Lee S. T..(2006).Electron mobility of rare earth complexes measured by transient electroluminescence method.Solid-State Electronics,50(9—10),1584-1587.
MLA	Zang F. X.,et al."Electron mobility of rare earth complexes measured by transient electroluminescence method".Solid-State Electronics 50.9—10(2006):1584-1587.