| Research on monocrystalline silicon defect detection based on wavelet singularity | |
| Wu Wei; Qiu Zongming; Huang Qiu Hong | |
| 2015 | |
| 会议名称 | PROCEEDINGS OF THE 2015 JOINT INTERNATIONAL MECHANICAL, ELECTRONIC AND INFORMATION TECHNOLOGY CONFERENCE (JIMET 2015) |
| 会议日期 | 2015-01-01 |
| 关键词 | monocrystalline silicon defect wavelet transform Lipschitz exponent |
| 页码 | 609-619 |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000373134100115 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4991529 |
| 专题 | 西安理工大学 |
| 推荐引用方式 GB/T 7714 | Wu Wei,Qiu Zongming,Huang Qiu Hong. Research on monocrystalline silicon defect detection based on wavelet singularity[C]. 见:PROCEEDINGS OF THE 2015 JOINT INTERNATIONAL MECHANICAL, ELECTRONIC AND INFORMATION TECHNOLOGY CONFERENCE (JIMET 2015). 2015-01-01. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论