Electronic and mechanical property of high electron mobility semiconductor Bi2O2Se | |
Liu, Jiang; Tian, Liqiang; Mou, Yao; Jia, Wanli; Zhang, Lin; Liu, Rujun | |
2018 | |
卷号 | 764页码:674-678 |
关键词 | Bi2O2Se Electronic structure Mechanical property Debye-temperature Minimum thermal conductivity First-principles calculation |
ISSN号 | 0925-8388 |
DOI | 10.1016/j.jallcom.2018.06.120 |
URL标识 | 查看原文 |
WOS记录号 | WOS:000444058300080 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4974242 |
专题 | 西安理工大学 |
推荐引用方式 GB/T 7714 | Liu, Jiang,Tian, Liqiang,Mou, Yao,et al. Electronic and mechanical property of high electron mobility semiconductor Bi2O2Se[J],2018,764:674-678. |
APA | Liu, Jiang,Tian, Liqiang,Mou, Yao,Jia, Wanli,Zhang, Lin,&Liu, Rujun.(2018).Electronic and mechanical property of high electron mobility semiconductor Bi2O2Se.,764,674-678. |
MLA | Liu, Jiang,et al."Electronic and mechanical property of high electron mobility semiconductor Bi2O2Se".764(2018):674-678. |
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