| Spherical measuring device of secondary electron emission coefficient based on pulsed electron beam | |
| Wen, Kaile; Liu, Shulin; Yan, Baojun; Yu, Yang; Yang, Yuzhen | |
| 2018 | |
| 会议名称 | International Conference on Technology and Instrumentation in Particle Physics, TIPP 2017 |
| 会议日期 | 2017-05-22 |
| 会议地点 | Beijing, China |
| 页码 | 113-116 |
| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4972384 |
| 专题 | 西安理工大学 |
| 推荐引用方式 GB/T 7714 | Wen, Kaile,Liu, Shulin,Yan, Baojun,et al. Spherical measuring device of secondary electron emission coefficient based on pulsed electron beam[C]. 见:International Conference on Technology and Instrumentation in Particle Physics, TIPP 2017. Beijing, China. 2017-05-22. |
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