| New approach to defect detection for NDT applications by using topological derivative | |
| Ge, L.L.; Zhang, Y.J. | |
| 2008 | |
| 关键词 | Computational costs Contrast to noise ratio Digitized radiographs Non destructive testing Pyramid Segmentation algorithms Topological derivatives X ray computerized tomography |
| 期号 | 543 CP |
| DOI | 10.1049/cp:20080374 |
| 页码 | 544-547 |
| 会议录 | IET Conference Publications
 |
| URL标识 | 查看原文 |
| ISSN号 | 9780863419140 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4846596 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Ge, L.L.,Zhang, Y.J.. New approach to defect detection for NDT applications by using topological derivative[C]. 见:. |
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