| Impurities evaporation from metallurgical-grade silicon in electron beam melting process | |
| Wang Qiang; Dong Wei; Tan Yi; Jiang Dachuan; Zhang Cong; Peng Xu | |
| 刊名 | RARE METALS
 |
| 2011 | |
| 卷号 | 30页码:274-277 |
| 关键词 | electron beam melting silicon evaporation impurities removal efficiency |
| ISSN号 | 1001-0521 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4839497 |
| 专题 | 大连理工大学 |
| 作者单位 | Dalian Univ Technol, Sch Mat Sci & Engn, Dalian 116024, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Wang Qiang,Dong Wei,Tan Yi,et al. Impurities evaporation from metallurgical-grade silicon in electron beam melting process[J]. RARE METALS,2011,30:274-277. |
| APA | Wang Qiang,Dong Wei,Tan Yi,Jiang Dachuan,Zhang Cong,&Peng Xu.(2011).Impurities evaporation from metallurgical-grade silicon in electron beam melting process.RARE METALS,30,274-277. |
| MLA | Wang Qiang,et al."Impurities evaporation from metallurgical-grade silicon in electron beam melting process".RARE METALS 30(2011):274-277. |
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