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The Reliability of Multi-parameter Insulation Diagnosis
Wu, Kai; Shen, Wei; Meng, YongPeng; Cao, Wen; Pan, Cheng; Cheng, Yonghong; Zhang, Xiaohong
刊名IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION
2010
卷号17期号:1页码:280-286
关键词insulation diagnosis choice of parameters Multi parameter
ISSN号1070-9878
DOI10.1109/TDEI.2010.5412028
URL标识查看原文
WOS记录号WOS:000274818900035
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4813530
专题西安交通大学
推荐引用方式
GB/T 7714
Wu, Kai,Shen, Wei,Meng, YongPeng,et al. The Reliability of Multi-parameter Insulation Diagnosis[J]. IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,2010,17(1):280-286.
APA Wu, Kai.,Shen, Wei.,Meng, YongPeng.,Cao, Wen.,Pan, Cheng.,...&Zhang, Xiaohong.(2010).The Reliability of Multi-parameter Insulation Diagnosis.IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,17(1),280-286.
MLA Wu, Kai,et al."The Reliability of Multi-parameter Insulation Diagnosis".IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 17.1(2010):280-286.
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