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	Tree-like Breakdown Phenomena of Dielectric Window under X-band High Power Microwave in Vacuum
	Qiu, Shi; Hao, Xi-Wei; Zhang, Guan-Jun; Liu, Guo-Zhi; Hou, Qing; Huang, Wen-Hua; Zhang, Zhi-Qiang; Zhu, Xiao-Xin
刊名	IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION
	2010
卷号	17期号:3页码:971-977
关键词	Dielectric breakdown Photography Microwave technology Surface treatment
ISSN号	1070-9878
DOI	10.1109/TDEI.2010.5492274
URL标识	查看原文
WOS记录号	WOS:000281865900041
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4812496
专题	西安交通大学
推荐引用方式 GB/T 7714	Qiu, Shi,Hao, Xi-Wei,Zhang, Guan-Jun,et al. Tree-like Breakdown Phenomena of Dielectric Window under X-band High Power Microwave in Vacuum[J]. IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,2010,17(3):971-977.
APA	Qiu, Shi.,Hao, Xi-Wei.,Zhang, Guan-Jun.,Liu, Guo-Zhi.,Hou, Qing.,...&Zhu, Xiao-Xin.(2010).Tree-like Breakdown Phenomena of Dielectric Window under X-band High Power Microwave in Vacuum.IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,17(3),971-977.
MLA	Qiu, Shi,et al."Tree-like Breakdown Phenomena of Dielectric Window under X-band High Power Microwave in Vacuum".IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 17.3(2010):971-977.

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