Mapping & Measuring Converging Technologies Between Nanotechnology and Communication technology via Patent Analysis | |
Luan CJ(栾春娟); Sun MX(孙孟新) | |
2012 | |
会议名称 | International Conference on Webometrics, Informetrics and Scientometrics & 13th COLLNET Meeting |
页码 | - |
会议录 | International Conference on Webometrics, Informetrics and Scientometrics & 13th COLLNET Meeting |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4806382 |
专题 | 大连理工大学 |
推荐引用方式 GB/T 7714 | Luan CJ,Sun MX. Mapping & Measuring Converging Technologies Between Nanotechnology and Communication technology via Patent Analysis[C]. 见:International Conference on Webometrics, Informetrics and Scientometrics & 13th COLLNET Meeting. |
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