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Numerical Simulation and Experimental Verification of Copper Plating with Different Additives for Through Silicon Vias
Song, Chongshen; Wu, Heng; Jing, Xiangmeng; Dai, Fengwei; Yu, Daquan; Wan, Lixi
2012
会议名称4th Electronic System-Integration Technology Conference (ESTC)
会议日期2012-09-17
会议地点Amsterdam, NETHERLANDS
页码-
会议录4th Electronic System-Integration Technology Conference (ESTC)
URL标识查看原文
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/4804427
专题大连理工大学
作者单位1.Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China.
2.Dalian Univ Technol, Dalian 116024, Peoples R China.
3.Jiangsu R&D Ctr Internet Things, Wuxi, Jiangsu 214315, Peoples R China.
4.Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China.
5.Jiangsu R&D Ctr Internet Things, Wuxi, Jiangsu 214315, Peoples R China.
推荐引用方式
GB/T 7714
Song, Chongshen,Wu, Heng,Jing, Xiangmeng,et al. Numerical Simulation and Experimental Verification of Copper Plating with Different Additives for Through Silicon Vias[C]. 见:4th Electronic System-Integration Technology Conference (ESTC). Amsterdam, NETHERLANDS. 2012-09-17.
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