Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry | |
Li, J.; Wang, Y. R.; Meng, X. F.; Yang, X. L.; Wang, Q. P. | |
刊名 | OPTICS AND LASER TECHNOLOGY
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2014 | |
卷号 | 56页码:241-246 |
关键词 | Thickness variation Optical inhomogeneity Dual-wavelength phase-shifting interferometry |
DOI | 10.1016/j.optlastec.2013.08.019 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4801870 |
专题 | 山东大学 |
作者单位 | Shandong Univ, Sch Informat Sci & Engn, Shandong Prov Key Lab Laser Technol & Applicat, J |
推荐引用方式 GB/T 7714 | Li, J.,Wang, Y. R.,Meng, X. F.,et al. Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry[J]. OPTICS AND LASER TECHNOLOGY,2014,56:241-246. |
APA | Li, J.,Wang, Y. R.,Meng, X. F.,Yang, X. L.,&Wang, Q. P..(2014).Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry.OPTICS AND LASER TECHNOLOGY,56,241-246. |
MLA | Li, J.,et al."Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry".OPTICS AND LASER TECHNOLOGY 56(2014):241-246. |
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