QQ客服 官方微博 反馈留言

	Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry
	Li, J.; Wang, Y. R.; Meng, X. F.; Yang, X. L.; Wang, Q. P.
刊名	OPTICS AND LASER TECHNOLOGY
	2014
卷号	56页码:241-246
关键词	Thickness variation Optical inhomogeneity Dual-wavelength phase-shifting interferometry
DOI	10.1016/j.optlastec.2013.08.019
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4801870
专题	山东大学
作者单位	Shandong Univ, Sch Informat Sci & Engn, Shandong Prov Key Lab Laser Technol & Applicat, J
推荐引用方式 GB/T 7714	Li, J.,Wang, Y. R.,Meng, X. F.,et al. Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry[J]. OPTICS AND LASER TECHNOLOGY,2014,56:241-246.
APA	Li, J.,Wang, Y. R.,Meng, X. F.,Yang, X. L.,&Wang, Q. P..(2014).Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry.OPTICS AND LASER TECHNOLOGY,56,241-246.
MLA	Li, J.,et al."Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry".OPTICS AND LASER TECHNOLOGY 56(2014):241-246.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。