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	Effects of annealing temperatures on crystalline quality of silicon based (Ba0.3Sr0.7)(Zn1/3Nb2/3)O-3 dielectric ceramic thin films by sol-gel process
	Cao, Gang; Wu, Shihua; Shi, Feng
刊名	JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
	2015
卷号	26期号:1页码:217-221
DOI	10.1007/s10854-014-2386-0
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4781522
专题	山东大学
作者单位	1.Shandong Univ Finance & Econ, Sch Management Sci & Engn, Jinan 250014, Peoples R China. 2.Shandong Normal Univ, C
推荐引用方式 GB/T 7714	Cao, Gang,Wu, Shihua,Shi, Feng. Effects of annealing temperatures on crystalline quality of silicon based (Ba0.3Sr0.7)(Zn1/3Nb2/3)O-3 dielectric ceramic thin films by sol-gel process[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2015,26(1):217-221.
APA	Cao, Gang,Wu, Shihua,&Shi, Feng.(2015).Effects of annealing temperatures on crystalline quality of silicon based (Ba0.3Sr0.7)(Zn1/3Nb2/3)O-3 dielectric ceramic thin films by sol-gel process.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,26(1),217-221.
MLA	Cao, Gang,et al."Effects of annealing temperatures on crystalline quality of silicon based (Ba0.3Sr0.7)(Zn1/3Nb2/3)O-3 dielectric ceramic thin films by sol-gel process".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 26.1(2015):217-221.

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