Extraction of Model Card in Metal Oxide Thin-Film Transistor by Fitting Measured Curves with RPI Model and Simulation of Circuits | |
Wei, Xixiong[1]; Zhuang, Feng[1]; Zhou, Zheng[1]; Wu, Weijing[2]; Ma, Xiaoyu[1]; Deng, Wanling[1] | |
会议日期 | DEC 14-16, 2017 |
会议地点 | Haining, PEOPLES R CHINA |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4780283 |
专题 | 暨南大学 |
作者单位 | 1.[1]Jinan Univ, Dept Elect Engn, Guangzhou, Guangdong, Peoples R China 2.[2]South China Univ Technol, State Key Lab Luminescent Mat & Devices, Guangzhou, Guangdong, Peoples R China |
推荐引用方式 GB/T 7714 | Wei, Xixiong[1],Zhuang, Feng[1],Zhou, Zheng[1],et al. Extraction of Model Card in Metal Oxide Thin-Film Transistor by Fitting Measured Curves with RPI Model and Simulation of Circuits[C]. 见:. Haining, PEOPLES R CHINA. DEC 14-16, 2017. |
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