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	Extraction of Model Card in Metal Oxide Thin-Film Transistor by Fitting Measured Curves with RPI Model and Simulation of Circuits
	Wei, Xixiong[1]; Zhuang, Feng[1]; Zhou, Zheng[1]; Wu, Weijing[2]; Ma, Xiaoyu[1]; Deng, Wanling[1]
会议日期	DEC 14-16, 2017
会议地点	Haining, PEOPLES R CHINA
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/4780283
专题	暨南大学
作者单位	1.[1]Jinan Univ, Dept Elect Engn, Guangzhou, Guangdong, Peoples R China 2.[2]South China Univ Technol, State Key Lab Luminescent Mat & Devices, Guangzhou, Guangdong, Peoples R China
推荐引用方式 GB/T 7714	Wei, Xixiong[1],Zhuang, Feng[1],Zhou, Zheng[1],et al. Extraction of Model Card in Metal Oxide Thin-Film Transistor by Fitting Measured Curves with RPI Model and Simulation of Circuits[C]. 见:. Haining, PEOPLES R CHINA. DEC 14-16, 2017.

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