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An Approximation of Three-Dimensional Semiconductor Devices by Mixed Finite Element Method and Characteristics-Mixed Finite Element Method
Yang, Qing; Yuan, Yirang
刊名高等学校计算数学学报
2015
卷号8期号:3页码:356-382
关键词Three-dimensional semiconductor devices characteristics-mixed finite element method mixed finite element method post-processing step error bound
DOI10.4208/nmtma.2015.my12031
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4779681
专题山东大学
作者单位1.School of Mathematical Science, Shandong Normal University, Jinan, Shandong 250014, China.
2.Institute of Mathematics, Shandon
推荐引用方式
GB/T 7714
Yang, Qing,Yuan, Yirang. An Approximation of Three-Dimensional Semiconductor Devices by Mixed Finite Element Method and Characteristics-Mixed Finite Element Method[J]. 高等学校计算数学学报,2015,8(3):356-382.
APA Yang, Qing,&Yuan, Yirang.(2015).An Approximation of Three-Dimensional Semiconductor Devices by Mixed Finite Element Method and Characteristics-Mixed Finite Element Method.高等学校计算数学学报,8(3),356-382.
MLA Yang, Qing,et al."An Approximation of Three-Dimensional Semiconductor Devices by Mixed Finite Element Method and Characteristics-Mixed Finite Element Method".高等学校计算数学学报 8.3(2015):356-382.
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