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	Extraction of model card in metal oxide thin-film transistor by fitting measured curves with RPI model and simulation of circuits
	Wei, Xixiong[1]; Zhuang, Feng[1]; Zhou, Zheng[1]; Wu, Weijing[2]; Ma, Xiaoyu[1]; Deng, Wanling[1]
会议日期	December 14, 2017 - December 16, 2017
会议地点	Haining, Zhejiang, China
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/4753722
专题	暨南大学
作者单位	1.[1] Department of Electronic Engineering, Jinan University, Guangzhou, China 2.[2] State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou, China
推荐引用方式 GB/T 7714	Wei, Xixiong[1],Zhuang, Feng[1],Zhou, Zheng[1],et al. Extraction of model card in metal oxide thin-film transistor by fitting measured curves with RPI model and simulation of circuits[C]. 见:. Haining, Zhejiang, China. December 14, 2017 - December 16, 2017.

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