Tracking sodium migration in TiS using in situ TEM | |
Bo Han; Shulin Chen; Jian Zou; Ruiwen Shao; Zhipeng Dou; Chen Yang; Xiumei Ma; Jing Lu; Kaihui Liu; Dapeng Yu | |
刊名 | Nanoscale |
2019 | |
卷号 | Vol.11 No.15页码:7474-7480 |
ISSN号 | 2040-3364;2040-3372 |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4751965 |
专题 | 湖南大学 |
作者单位 | 1.Corresponding authors 2.a National Center for Materials Service Safety, University of Science and Technology Beijing, Beijing 100083, China E-mail: hcwang@mater.ustb.edu.cn 3.Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China E-mail: p-gao@pku.edu.cn 4.State Key Laboratory of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China 5.School of Materials and Energy, State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China E-mail: lipingwang@uestc.edu.cn 6.Key Laboratory for Micro-/Nano-Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha 410082, China 7.f State Key Laboratory for Artificial Microstructure & Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China 8.g Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, China 9.h Collaborative Innovation Center of Quantum Matter, Beijing 100871, China 10.i Shenzhen Key Laboratory of Quantum Science and Engineering, Shenzhen 518055, China |
推荐引用方式 GB/T 7714 | Bo Han,Shulin Chen,Jian Zou,et al. Tracking sodium migration in TiS using in situ TEM[J]. Nanoscale,2019,Vol.11 No.15:7474-7480. |
APA | Bo Han.,Shulin Chen.,Jian Zou.,Ruiwen Shao.,Zhipeng Dou.,...&Peng Gao.(2019).Tracking sodium migration in TiS using in situ TEM.Nanoscale,Vol.11 No.15,7474-7480. |
MLA | Bo Han,et al."Tracking sodium migration in TiS using in situ TEM".Nanoscale Vol.11 No.15(2019):7474-7480. |
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