Fast Screening of High-Risk Lines Under False Data Injection Attacks | |
Che, L; Liu, X; Li, ZY | |
刊名 | IEEE TRANSACTIONS ON SMART GRID
![]() |
2019 | |
卷号 | Vol.10 No.4页码:4003-4014 |
关键词 | Cyber-security false data injection attacks overload risk line screening vulnerability assessment |
ISSN号 | 1949-3053;1949-3061 |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4749521 |
专题 | 湖南大学 |
作者单位 | 1.Hunan Univ, Dept Elect & Informat Engn, Changsha 410000, Hunan, Peoples R China 2.Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China 3.IIT, Elect & Comp Engn, Chicago, IL 60616 USA |
推荐引用方式 GB/T 7714 | Che, L,Liu, X,Li, ZY. Fast Screening of High-Risk Lines Under False Data Injection Attacks[J]. IEEE TRANSACTIONS ON SMART GRID,2019,Vol.10 No.4:4003-4014. |
APA | Che, L,Liu, X,&Li, ZY.(2019).Fast Screening of High-Risk Lines Under False Data Injection Attacks.IEEE TRANSACTIONS ON SMART GRID,Vol.10 No.4,4003-4014. |
MLA | Che, L,et al."Fast Screening of High-Risk Lines Under False Data Injection Attacks".IEEE TRANSACTIONS ON SMART GRID Vol.10 No.4(2019):4003-4014. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论