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Fast Screening of High-Risk Lines Under False Data Injection Attacks
Che, L; Liu, X; Li, ZY
刊名IEEE TRANSACTIONS ON SMART GRID
2019
卷号Vol.10 No.4页码:4003-4014
关键词Cyber-security false data injection attacks overload risk line screening vulnerability assessment
ISSN号1949-3053;1949-3061
URL标识查看原文
公开日期[db:dc_date_available]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4749521
专题湖南大学
作者单位1.Hunan Univ, Dept Elect & Informat Engn, Changsha 410000, Hunan, Peoples R China
2.Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China
3.IIT, Elect & Comp Engn, Chicago, IL 60616 USA
推荐引用方式
GB/T 7714
Che, L,Liu, X,Li, ZY. Fast Screening of High-Risk Lines Under False Data Injection Attacks[J]. IEEE TRANSACTIONS ON SMART GRID,2019,Vol.10 No.4:4003-4014.
APA Che, L,Liu, X,&Li, ZY.(2019).Fast Screening of High-Risk Lines Under False Data Injection Attacks.IEEE TRANSACTIONS ON SMART GRID,Vol.10 No.4,4003-4014.
MLA Che, L,et al."Fast Screening of High-Risk Lines Under False Data Injection Attacks".IEEE TRANSACTIONS ON SMART GRID Vol.10 No.4(2019):4003-4014.
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