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An improved analytical model for the statistics of SET emergence point in HfO memristive device
Dong Xiang; Rulin Zhang; Yu Li; Cong Ye; Enrique Miranda; Jordi Suñé; Shibing Long
刊名AIP Advances
2019
卷号Vol.9 No.2页码:025118
URL标识查看原文
公开日期[db:dc_date_available]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4746134
专题湖南大学
作者单位1.School of Mechatronics Engineering, Harbin Institute of Technology, Harbin 150001, China
2.Hubei Key Laboratory of Applied Mathematics, Faculty of Physics and Electronic Science, Hubei University, Wuhan 430062, China
3.Key Laboratory of Microelectronics Devices & Integration Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China
4.Departamentd’Enginyeria Electrònica, Universitat Autònoma de Barcelona, Bellaterra 08193, Spain
5.School of Microelectronics, University of Science and Technology of China, Hefei 230027, China a) Corresponding authors: yecong@issp.ac.cn
6.shibinglong@ustc.edu.cn
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GB/T 7714
Dong Xiang,Rulin Zhang,Yu Li,et al. An improved analytical model for the statistics of SET emergence point in HfO memristive device[J]. AIP Advances,2019,Vol.9 No.2:025118.
APA Dong Xiang.,Rulin Zhang.,Yu Li.,Cong Ye.,Enrique Miranda.,...&Shibing Long.(2019).An improved analytical model for the statistics of SET emergence point in HfO memristive device.AIP Advances,Vol.9 No.2,025118.
MLA Dong Xiang,et al."An improved analytical model for the statistics of SET emergence point in HfO memristive device".AIP Advances Vol.9 No.2(2019):025118.
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