CORC  > 山东大学
Impact of etching on the surface leakage generation in mesa-type InGaAs/InAlAs avalanche photodetectors
Ma, Yingjie; Zhang, Yonggang; Gu, Yi; Chen, Xingyou; Shi, Yanhui; Ji, Wanyan; Xi, Suping; Du, Ben; Li, Xiaoliang; Tang, Hengjing
刊名OPTICS EXPRESS
2016
卷号24期号:7页码:7823-7834
DOI10.1364/OE.24.007823
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4713354
专题山东大学
作者单位Chinese Acad Sci, Shanghai Inst Mic
推荐引用方式
GB/T 7714
Ma, Yingjie,Zhang, Yonggang,Gu, Yi,et al. Impact of etching on the surface leakage generation in mesa-type InGaAs/InAlAs avalanche photodetectors[J]. OPTICS EXPRESS,2016,24(7):7823-7834.
APA Ma, Yingjie.,Zhang, Yonggang.,Gu, Yi.,Chen, Xingyou.,Shi, Yanhui.,...&Geng D.(2016).Impact of etching on the surface leakage generation in mesa-type InGaAs/InAlAs avalanche photodetectors.OPTICS EXPRESS,24(7),7823-7834.
MLA Ma, Yingjie,et al."Impact of etching on the surface leakage generation in mesa-type InGaAs/InAlAs avalanche photodetectors".OPTICS EXPRESS 24.7(2016):7823-7834.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace