Effect of polarization Coulomb field scattering on low temperature electron mobility in strained AlGaN/AlN/GaN heterostructure field-effect transistors | |
Liu, Yan; Lin, Zhao-Jun; Yang, Ming; Luan, Chong-Biao; Wang, Yu-Tang; Lv, Yuan-Jie; Feng, Zhi-Hong | |
刊名 | MODERN PHYSICS LETTERS B
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2016 | |
卷号 | 30期号:35 |
关键词 | AlGaN/AlN/GaN heterostructure field-effect transistor polarization Coulomb field scattering two-dimensional electron gas electron mobility |
DOI | 10.1142/S021798491650411X |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4708571 |
专题 | 山东大学 |
作者单位 | 1.Shandong Univ, Sch Phys, Jinan 250100, Peoples R China. 2.[Lv, |
推荐引用方式 GB/T 7714 | Liu, Yan,Lin, Zhao-Jun,Yang, Ming,et al. Effect of polarization Coulomb field scattering on low temperature electron mobility in strained AlGaN/AlN/GaN heterostructure field-effect transistors[J]. MODERN PHYSICS LETTERS B,2016,30(35). |
APA | Liu, Yan.,Lin, Zhao-Jun.,Yang, Ming.,Luan, Chong-Biao.,Wang, Yu-Tang.,...&Feng, Zhi-Hong.(2016).Effect of polarization Coulomb field scattering on low temperature electron mobility in strained AlGaN/AlN/GaN heterostructure field-effect transistors.MODERN PHYSICS LETTERS B,30(35). |
MLA | Liu, Yan,et al."Effect of polarization Coulomb field scattering on low temperature electron mobility in strained AlGaN/AlN/GaN heterostructure field-effect transistors".MODERN PHYSICS LETTERS B 30.35(2016). |
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