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THz Transmittance and Electrical Properties Tuning across IMT in Vanadium Dioxide Films by Al Doping
Wu, Xuefei; Wu, Zhiming; Ji, Chunhui; Zhang, Huafu; Su, Yuanjie; Huang, Zehua; Gou, Jun; Wei, Xiongbang; Wang, Jun; Jiang, Yadong
刊名ACS APPLIED MATERIALS & INTERFACES
2016
卷号8期号:18页码:11842-11850
关键词vanadium dioxide insulator-metal transition Raman shift THz transmittance Al doping
DOI10.1021/acsami.5b12417
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4703362
专题山东大学
作者单位Univ Elect Sci & Technol China,
推荐引用方式
GB/T 7714
Wu, Xuefei,Wu, Zhiming,Ji, Chunhui,et al. THz Transmittance and Electrical Properties Tuning across IMT in Vanadium Dioxide Films by Al Doping[J]. ACS APPLIED MATERIALS & INTERFACES,2016,8(18):11842-11850.
APA Wu, Xuefei.,Wu, Zhiming.,Ji, Chunhui.,Zhang, Huafu.,Su, Yuanjie.,...&Jiang, Yadong.(2016).THz Transmittance and Electrical Properties Tuning across IMT in Vanadium Dioxide Films by Al Doping.ACS APPLIED MATERIALS & INTERFACES,8(18),11842-11850.
MLA Wu, Xuefei,et al."THz Transmittance and Electrical Properties Tuning across IMT in Vanadium Dioxide Films by Al Doping".ACS APPLIED MATERIALS & INTERFACES 8.18(2016):11842-11850.
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