| EXPLOITING PATCH-BASED CORRELATION FOR GHOST REMOVAL IN EXPOSURE FUSION | |
| Hu, Shengnan; Zhang, Wei | |
| 刊名 | 2017 IEEE INTERNATIONAL CONFERENCE ON MULTIMEDIA AND EXPO (ICME)
 |
| 2017 | |
| 页码 | 1099-1104 |
| 关键词 | Exposure fusion high dynamic range (HDR) deghosting structure contrast |
| DOI | 10.1109/ICME.2017.8019319 |
| 会议名称 | IEEE International Conference on Multimedia and Expo (ICME) |
| URL标识 | 查看原文 |
| 会议日期 | JUL 10-14, 2017 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4685974 |
| 专题 | 山东大学 |
| 作者单位 | Shandong Univ, Sch Control Sci & Engn, Jinan, Shandong, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Hu, Shengnan,Zhang, Wei. EXPLOITING PATCH-BASED CORRELATION FOR GHOST REMOVAL IN EXPOSURE FUSION[J]. 2017 IEEE INTERNATIONAL CONFERENCE ON MULTIMEDIA AND EXPO (ICME),2017:1099-1104. |
| APA | Hu, Shengnan,&Zhang, Wei.(2017).EXPLOITING PATCH-BASED CORRELATION FOR GHOST REMOVAL IN EXPOSURE FUSION.2017 IEEE INTERNATIONAL CONFERENCE ON MULTIMEDIA AND EXPO (ICME),1099-1104. |
| MLA | Hu, Shengnan,et al."EXPLOITING PATCH-BASED CORRELATION FOR GHOST REMOVAL IN EXPOSURE FUSION".2017 IEEE INTERNATIONAL CONFERENCE ON MULTIMEDIA AND EXPO (ICME) (2017):1099-1104. |
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