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Analysis on Contact Forms of Interface in Wafer CMP Based on Lubricating Behavior
Zhang, Shengfang; Su, Jianxiu; Du, Jiaxi; Kang, Renke
2012
会议名称6th International Conference on Physical and Numerical Simulation of Materials Processing (ICPNS)
会议日期2010-11-16
会议地点Guilin Univ Elect Technol, Guilin, PEOPLES R CHINA
关键词Chemical mechanical polishing material removal mechanism lubrication form boundary lubrication
页码313-+
会议录6th International Conference on Physical and Numerical Simulation of Materials Processing (ICPNS)
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内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/4671776
专题大连理工大学
作者单位1.School of Mechanical Engineering, Dalian Jiaotong University, Dalian 116028, China
2.Henan Institute of Science and Technology, Xinxiang 453003, China
3.Key Laboratory for Precision and Non-Traditional Machining Technology of Ministry of Education, Dalian University of Technology, Dalian 116024, China
推荐引用方式
GB/T 7714
Zhang, Shengfang,Su, Jianxiu,Du, Jiaxi,et al. Analysis on Contact Forms of Interface in Wafer CMP Based on Lubricating Behavior[C]. 见:6th International Conference on Physical and Numerical Simulation of Materials Processing (ICPNS). Guilin Univ Elect Technol, Guilin, PEOPLES R CHINA. 2010-11-16.
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