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	Thermal and light induced surface instability of perovskite films in the photoelectron spectroscopy measurement
	Chen, Si[1]; Du, Xiang[2]; Lin, Dongxu[2]; Xie, Fangyan[1]; Xie, Weiguang[2]; Gong, Li[1]; Zhang, Weihong[1]; Liu, Pengyi[2]; Chen, Jian[1,3]
	2018
卷号	229页码:108
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4644678
专题	暨南大学
作者单位	1.[1] Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou, 510275, China 2.[2] Siyuan Laboratory, Guangdong Provincial Engineering Technology Research Center of Vacuum Coating Technologies and New Energy Materials, Department of Physics, Jinan University, Guangzhou, Guangdong, 510632, China 3.[3] School of Materials Science and Engineering, Sun Yat-sen University, Guangzhou, 510275, China
推荐引用方式 GB/T 7714	Chen, Si[1],Du, Xiang[2],Lin, Dongxu[2],et al. Thermal and light induced surface instability of perovskite films in the photoelectron spectroscopy measurement[J],2018,229:108.
APA	Chen, Si[1].,Du, Xiang[2].,Lin, Dongxu[2].,Xie, Fangyan[1].,Xie, Weiguang[2].,...&Chen, Jian[1,3].(2018).Thermal and light induced surface instability of perovskite films in the photoelectron spectroscopy measurement.,229,108.
MLA	Chen, Si[1],et al."Thermal and light induced surface instability of perovskite films in the photoelectron spectroscopy measurement".229(2018):108.

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