Optical imaging based on compressive sensing

CORC > 西安光学精密机械研究所 > 中国科学院西安光学精密机械研究所 > 光电测量技术实验室

	Optical imaging based on compressive sensing
	LiShen ; MaCai-Wen ; XiaAi-Li
	2011
会议名称	international symposium on photoelectronic detection and imaging 2011: advances in imaging detectors and applications
会议日期	may 24, 2011 - may 26, 2014
会议地点	beijing, china
关键词	Sparsity Data acquisition Image Coding Reconstruction algorithms Single-pixel camera Compressive sensing
页码	81942h
通讯作者	li shen
英文摘要	compressive sensing (cs) is a new sampling framework that provides an alternative to the well-known shannon sampling theory. the basic idea of cs theory is that a signal or image, unknown but supposed to be sparse or compressible in some basis, can be subjected to fewer measurements than the nominal number of pixels, and yet be accurately reconstructed. by designing optical sensors to measure inner products between the scene and a set of test functions according to cs theory, we can use sophisticated computational methods to infer critical scene structure and content for significantly economizing the resources in data acquisition store and transmit. in this paper, we investigate how cs can provide new insights into optical imaging including optical devices. we first give a brief overview of the cs theory and reviews associated fast numerical reconstruction algorithms. next, this paper explores the potential of several different physically realizable optical systems based on cs principles. in the end, we briefly discuss possible implication in the areas of data compression and optical imaging.
收录类别	EI ; CPCI
产权排序	1
会议主办者	chinese society of astronautics (cas)
会议录	proceedings of spie - the international society for optical engineering
会议录出版者	spie
会议录出版地	p.o. box 10, bellingham, wa 98227-0035, united states
语种	英语
ISSN号	0277-786x
内容类型	会议论文
源URL	[http://ir.opt.ac.cn/handle/181661/20011]
专题	西安光学精密机械研究所_光电测量技术实验室
推荐引用方式 GB/T 7714	LiShen,MaCai-Wen,XiaAi-Li. Optical imaging based on compressive sensing[C]. 见:international symposium on photoelectronic detection and imaging 2011: advances in imaging detectors and applications. beijing, china. may 24, 2011 - may 26, 2014.