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Stress and optical constants in thin films of BaF2-PrF3: A potential Th-free infrared low-index evaporation material
Lv, Xuwen; Zheng, Weimin; Xie, Ping; Li, Bin; He, Weixiang; Jing, Chao; Liu, Dingquan
刊名Optik
2018
卷号173页码:174-179
DOI10.1016/j.ijleo.2018.08.020
URL标识查看原文
公开日期[db:dc_date_available]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4581305
专题山东大学
作者单位1.Department of Physics, Shanghai University, Shanghai
2.200444, China
3.[Lv, Xuwen
4.Xie, Ping
5.Li, Bin
6.He, Weixian
推荐引用方式
GB/T 7714
Lv, Xuwen,Zheng, Weimin,Xie, Ping,et al. Stress and optical constants in thin films of BaF2-PrF3: A potential Th-free infrared low-index evaporation material[J]. Optik,2018,173:174-179.
APA Lv, Xuwen.,Zheng, Weimin.,Xie, Ping.,Li, Bin.,He, Weixiang.,...&Liu, Dingquan.(2018).Stress and optical constants in thin films of BaF2-PrF3: A potential Th-free infrared low-index evaporation material.Optik,173,174-179.
MLA Lv, Xuwen,et al."Stress and optical constants in thin films of BaF2-PrF3: A potential Th-free infrared low-index evaporation material".Optik 173(2018):174-179.
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