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	Stress and optical constants in thin films of BaF2-PrF3: A potential Th-free infrared low-index evaporation material
	Lva, Xuwen; Zheng, Weimin; Xie, Ping; Li, Bin; He, Weixiang; Jing, Chao; Liu, Dingquan
刊名	OPTIK
	2018
卷号	173页码:174-179
关键词	Antireflection coatings Infrared Praseodymium fluoride Barium fluoride Electron beam evaporation Stress Optical constant
DOI	10.1016/j.ijleo.2018.08.020
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4568696
专题	山东大学
作者单位	1.Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China. 2.Shandong Univ, Sch Space Sci & P
推荐引用方式 GB/T 7714	Lva, Xuwen,Zheng, Weimin,Xie, Ping,et al. Stress and optical constants in thin films of BaF2-PrF3: A potential Th-free infrared low-index evaporation material[J]. OPTIK,2018,173:174-179.
APA	Lva, Xuwen.,Zheng, Weimin.,Xie, Ping.,Li, Bin.,He, Weixiang.,...&Liu, Dingquan.(2018).Stress and optical constants in thin films of BaF2-PrF3: A potential Th-free infrared low-index evaporation material.OPTIK,173,174-179.
MLA	Lva, Xuwen,et al."Stress and optical constants in thin films of BaF2-PrF3: A potential Th-free infrared low-index evaporation material".OPTIK 173(2018):174-179.

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