Robust type-II band alignment in Janus-MoSSe bilayer with extremely long carrier lifetime induced by the intrinsic electric field | |
Long, Chen; Dai, Ying; Gong, Zhi-Rui; Jin, Hao | |
刊名 | PHYSICAL REVIEW B
![]() |
2019 | |
卷号 | 99期号:11 |
DOI | 10.1103/PhysRevB.99.115316 |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4543260 |
专题 | 山东大学 |
作者单位 | 1.Shandong Univ, State Key Lab Crystal Mat, Sch Phys, Jinan 250100, Shandong, Peoples R China. 2.Shen |
推荐引用方式 GB/T 7714 | Long, Chen,Dai, Ying,Gong, Zhi-Rui,et al. Robust type-II band alignment in Janus-MoSSe bilayer with extremely long carrier lifetime induced by the intrinsic electric field[J]. PHYSICAL REVIEW B,2019,99(11). |
APA | Long, Chen,Dai, Ying,Gong, Zhi-Rui,&Jin, Hao.(2019).Robust type-II band alignment in Janus-MoSSe bilayer with extremely long carrier lifetime induced by the intrinsic electric field.PHYSICAL REVIEW B,99(11). |
MLA | Long, Chen,et al."Robust type-II band alignment in Janus-MoSSe bilayer with extremely long carrier lifetime induced by the intrinsic electric field".PHYSICAL REVIEW B 99.11(2019). |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论