CORC  > 大连理工大学
Improvement of the quality of GaN epilayer by combining a SiNx interlayer and changed GaN growth mode
Yang, Dechao; Liang, Hongwei; Qiu, Yu; Song, Shiwei; Liu, Yang; Shen, Rensheng; Luo, Yingmin; Du, Guotong
刊名JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
2013
卷号24页码:2716-2720
ISSN号0957-4522
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4540630
专题大连理工大学
作者单位1.Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130023, Peoples R China.
2.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116024, Peoples R China.
3.Chinese Acad Sci, State Key Lab Funct Mat Informat, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China.
4.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116024, Peoples R China.
5.Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130023, Peoples R China.
6.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116024, Peoples R China.
推荐引用方式
GB/T 7714
Yang, Dechao,Liang, Hongwei,Qiu, Yu,et al. Improvement of the quality of GaN epilayer by combining a SiNx interlayer and changed GaN growth mode[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2013,24:2716-2720.
APA Yang, Dechao.,Liang, Hongwei.,Qiu, Yu.,Song, Shiwei.,Liu, Yang.,...&Du, Guotong.(2013).Improvement of the quality of GaN epilayer by combining a SiNx interlayer and changed GaN growth mode.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,24,2716-2720.
MLA Yang, Dechao,et al."Improvement of the quality of GaN epilayer by combining a SiNx interlayer and changed GaN growth mode".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 24(2013):2716-2720.
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