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Improvement of quality and strain relaxation of GaN epilayer grown on SiC substrate by in situ SiNx interlayer
Song, Shiwei; Liu, Yang; Liang, Hongwei; Yang, Dechao; Zhang, Kexiong; Xia, Xiaochuan; Shen, Rensheng; Du, Guotong
刊名JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
2013
卷号24页码:2923-2927
ISSN号0957-4522
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4540618
专题大连理工大学
作者单位1.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116024, Peoples R China.
2.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116024, Peoples R China.
3.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China.
4.Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130023, Peoples R China.
5.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116024, Peoples R China.
6.Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130023, Peoples R China.
推荐引用方式
GB/T 7714
Song, Shiwei,Liu, Yang,Liang, Hongwei,et al. Improvement of quality and strain relaxation of GaN epilayer grown on SiC substrate by in situ SiNx interlayer[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2013,24:2923-2927.
APA Song, Shiwei.,Liu, Yang.,Liang, Hongwei.,Yang, Dechao.,Zhang, Kexiong.,...&Du, Guotong.(2013).Improvement of quality and strain relaxation of GaN epilayer grown on SiC substrate by in situ SiNx interlayer.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,24,2923-2927.
MLA Song, Shiwei,et al."Improvement of quality and strain relaxation of GaN epilayer grown on SiC substrate by in situ SiNx interlayer".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 24(2013):2923-2927.
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