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Current modeling and simulation of dual-material surrounding-gate MOSFET with asymmetric halo
Li, Zun-Chao; Xu, Jin-Peng; Liu, Lin-Lin
2010
关键词Current continuity Current drivability Current modeling Drain current models Dual material gate Dual materials Hot carrier reliability Surrounding gate MOSFETs
期号[db:dc_citation_issue]
DOI[db:dc_identifier_doi]
页码1904-1906
会议录ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings
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ISSN号9781424457984
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/4502776
专题西安交通大学
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Li, Zun-Chao,Xu, Jin-Peng,Liu, Lin-Lin. Current modeling and simulation of dual-material surrounding-gate MOSFET with asymmetric halo[C]. 见:.
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