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Study on scalable Coulombic degradation for estimating the lifetime of organic light-emitting devices
Zhang, Wenwen; Wu, Zhaoxin; Liang, Shixiong; Jiao, Bo; Zhang, Xinwen; Wang, Dawei; Hou, Xun; Chen, Zhijian; Gong, Qihuang
刊名JOURNAL OF PHYSICS D-APPLIED PHYSICS
2011
卷号44期号:[db:dc_citation_issue]
ISSN号0022-3727
DOI[db:dc_identifier_doi]
URL标识查看原文
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4498680
专题西安交通大学
推荐引用方式
GB/T 7714
Zhang, Wenwen,Wu, Zhaoxin,Liang, Shixiong,et al. Study on scalable Coulombic degradation for estimating the lifetime of organic light-emitting devices[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2011,44([db:dc_citation_issue]).
APA Zhang, Wenwen.,Wu, Zhaoxin.,Liang, Shixiong.,Jiao, Bo.,Zhang, Xinwen.,...&Gong, Qihuang.(2011).Study on scalable Coulombic degradation for estimating the lifetime of organic light-emitting devices.JOURNAL OF PHYSICS D-APPLIED PHYSICS,44([db:dc_citation_issue]).
MLA Zhang, Wenwen,et al."Study on scalable Coulombic degradation for estimating the lifetime of organic light-emitting devices".JOURNAL OF PHYSICS D-APPLIED PHYSICS 44.[db:dc_citation_issue](2011).
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