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	Negative capacitance induced by redistribution of oxygen vacancies in the fatigued BiFeO3-based thin film
	Ke, Qingqing; Lou, Xiaojie; Yang, Haibo; Kumar, Amit; Zeng, Kaiyang; Wang, John
刊名	APPLIED PHYSICS LETTERS
	2012
卷号	101期号:[db:dc_citation_issue]
ISSN号	0003-6951
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4481580
专题	西安交通大学
推荐引用方式 GB/T 7714	Ke, Qingqing,Lou, Xiaojie,Yang, Haibo,et al. Negative capacitance induced by redistribution of oxygen vacancies in the fatigued BiFeO3-based thin film[J]. APPLIED PHYSICS LETTERS,2012,101([db:dc_citation_issue]).
APA	Ke, Qingqing,Lou, Xiaojie,Yang, Haibo,Kumar, Amit,Zeng, Kaiyang,&Wang, John.(2012).Negative capacitance induced by redistribution of oxygen vacancies in the fatigued BiFeO3-based thin film.APPLIED PHYSICS LETTERS,101([db:dc_citation_issue]).
MLA	Ke, Qingqing,et al."Negative capacitance induced by redistribution of oxygen vacancies in the fatigued BiFeO3-based thin film".APPLIED PHYSICS LETTERS 101.[db:dc_citation_issue](2012).

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