ADC jitter estimation using a single frequency test without requiring coherent sampling | |
Wu, Minshun; Chen, Guican; Chen, Degang | |
刊名 | IEICE ELECTRONICS EXPRESS
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2012 | |
卷号 | 9期号:[db:dc_citation_issue]页码:1485-1491 |
关键词 | least square method sine wave fitting jitter ADC |
ISSN号 | 1349-2543 |
DOI | [db:dc_identifier_doi] |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4470836 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Wu, Minshun,Chen, Guican,Chen, Degang. ADC jitter estimation using a single frequency test without requiring coherent sampling[J]. IEICE ELECTRONICS EXPRESS,2012,9([db:dc_citation_issue]):1485-1491. |
APA | Wu, Minshun,Chen, Guican,&Chen, Degang.(2012).ADC jitter estimation using a single frequency test without requiring coherent sampling.IEICE ELECTRONICS EXPRESS,9([db:dc_citation_issue]),1485-1491. |
MLA | Wu, Minshun,et al."ADC jitter estimation using a single frequency test without requiring coherent sampling".IEICE ELECTRONICS EXPRESS 9.[db:dc_citation_issue](2012):1485-1491. |
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