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	ADC jitter estimation using a single frequency test without requiring coherent sampling
	Wu, Minshun; Chen, Guican; Chen, Degang
刊名	IEICE ELECTRONICS EXPRESS
	2012
卷号	9期号:[db:dc_citation_issue]页码:1485-1491
关键词	least square method sine wave fitting jitter ADC
ISSN号	1349-2543
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4470836
专题	西安交通大学
推荐引用方式 GB/T 7714	Wu, Minshun,Chen, Guican,Chen, Degang. ADC jitter estimation using a single frequency test without requiring coherent sampling[J]. IEICE ELECTRONICS EXPRESS,2012,9([db:dc_citation_issue]):1485-1491.
APA	Wu, Minshun,Chen, Guican,&Chen, Degang.(2012).ADC jitter estimation using a single frequency test without requiring coherent sampling.IEICE ELECTRONICS EXPRESS,9([db:dc_citation_issue]),1485-1491.
MLA	Wu, Minshun,et al."ADC jitter estimation using a single frequency test without requiring coherent sampling".IEICE ELECTRONICS EXPRESS 9.[db:dc_citation_issue](2012):1485-1491.

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