Effects of Copper Plating Thickness of Ni/Fe Alloy Leadframe on Thermo-Mechanical and Die Cracking Behaviors of Small Outline Transistor (SOT) Packages | |
Li, Weiqiang; Chen, Haibin; Han, Jiale; Xue, Ke; Wong, Fei; Shiu, Ivan; Cheng, Guangxu; Wu, Jingshen | |
刊名 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY
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2013 | |
卷号 | 3期号:[db:dc_citation_issue]页码:1713-1719 |
关键词 | Copper plating die cracking thermal resistance |
ISSN号 | 2156-3950 |
DOI | [db:dc_identifier_doi] |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4449094 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Li, Weiqiang,Chen, Haibin,Han, Jiale,et al. Effects of Copper Plating Thickness of Ni/Fe Alloy Leadframe on Thermo-Mechanical and Die Cracking Behaviors of Small Outline Transistor (SOT) Packages[J]. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,2013,3([db:dc_citation_issue]):1713-1719. |
APA | Li, Weiqiang.,Chen, Haibin.,Han, Jiale.,Xue, Ke.,Wong, Fei.,...&Wu, Jingshen.(2013).Effects of Copper Plating Thickness of Ni/Fe Alloy Leadframe on Thermo-Mechanical and Die Cracking Behaviors of Small Outline Transistor (SOT) Packages.IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,3([db:dc_citation_issue]),1713-1719. |
MLA | Li, Weiqiang,et al."Effects of Copper Plating Thickness of Ni/Fe Alloy Leadframe on Thermo-Mechanical and Die Cracking Behaviors of Small Outline Transistor (SOT) Packages".IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY 3.[db:dc_citation_issue](2013):1713-1719. |
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