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Effects of Copper Plating Thickness of Ni/Fe Alloy Leadframe on Thermo-Mechanical and Die Cracking Behaviors of Small Outline Transistor (SOT) Packages
Li, Weiqiang; Chen, Haibin; Han, Jiale; Xue, Ke; Wong, Fei; Shiu, Ivan; Cheng, Guangxu; Wu, Jingshen
刊名IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY
2013
卷号3期号:[db:dc_citation_issue]页码:1713-1719
关键词Copper plating die cracking thermal resistance
ISSN号2156-3950
DOI[db:dc_identifier_doi]
URL标识查看原文
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4449094
专题西安交通大学
推荐引用方式
GB/T 7714
Li, Weiqiang,Chen, Haibin,Han, Jiale,et al. Effects of Copper Plating Thickness of Ni/Fe Alloy Leadframe on Thermo-Mechanical and Die Cracking Behaviors of Small Outline Transistor (SOT) Packages[J]. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,2013,3([db:dc_citation_issue]):1713-1719.
APA Li, Weiqiang.,Chen, Haibin.,Han, Jiale.,Xue, Ke.,Wong, Fei.,...&Wu, Jingshen.(2013).Effects of Copper Plating Thickness of Ni/Fe Alloy Leadframe on Thermo-Mechanical and Die Cracking Behaviors of Small Outline Transistor (SOT) Packages.IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,3([db:dc_citation_issue]),1713-1719.
MLA Li, Weiqiang,et al."Effects of Copper Plating Thickness of Ni/Fe Alloy Leadframe on Thermo-Mechanical and Die Cracking Behaviors of Small Outline Transistor (SOT) Packages".IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY 3.[db:dc_citation_issue](2013):1713-1719.
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