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	Improved key integrity checking for high-speed quantum key distribution using combinatorial group testing with strongly selective family design
	Fang, Junbin[1,2]; Jiang, Zoe L.[3]; Ren, Kexin[3]; Luo, Yunhan[1,2]; Chen, Zhe[1,2]; Liu, Weiping[1]; Wang, Xuan[3]; Niu, Xiamu[3]; Yiu, S. M.[4]; Hui, Lucas C. K.[4]
	2014
卷号	13期号:6页码:1425
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4448970
专题	暨南大学
作者单位	1.[1]Jinan Univ, Guangdong Higher Educ Inst, Key Lab Optoelect Informat & Sensing Technol, Guangzhou 510632, Guangdong, Peoples R China 2.[2]Jinan Univ, Dept Optoelect Engn, Guangzhou 510632, Guangdong, Peoples R China 3.[3]Harbin Inst Technol, Shenzhen Grad Sch, Shenzhen 518055, Peoples R China 4.[4]Univ Hong Kong, Dept Comp Sci, Hong Kong, Hong Kong, Peoples R China
推荐引用方式 GB/T 7714	Fang, Junbin[1,2],Jiang, Zoe L.[3],Ren, Kexin[3],et al. Improved key integrity checking for high-speed quantum key distribution using combinatorial group testing with strongly selective family design[J],2014,13(6):1425.
APA	Fang, Junbin[1,2].,Jiang, Zoe L.[3].,Ren, Kexin[3].,Luo, Yunhan[1,2].,Chen, Zhe[1,2].,...&Hui, Lucas C. K.[4].(2014).Improved key integrity checking for high-speed quantum key distribution using combinatorial group testing with strongly selective family design.,13(6),1425.
MLA	Fang, Junbin[1,2],et al."Improved key integrity checking for high-speed quantum key distribution using combinatorial group testing with strongly selective family design".13.6(2014):1425.

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