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	Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes
	Liang, Feng; Zhang, Luwen; Lei, Shaochong; Zhang, Guohe; Gao, Kaile; Liang, Bin
刊名	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
	2013
卷号	21期号:[db:dc_citation_issue]页码:614-623
关键词	single-input change (SIC) test pattern generator (TPG) low power Built-in self-test (BIST)
ISSN号	1063-8210
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4445125
专题	西安交通大学
推荐引用方式 GB/T 7714	Liang, Feng,Zhang, Luwen,Lei, Shaochong,et al. Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,2013,21([db:dc_citation_issue]):614-623.
APA	Liang, Feng,Zhang, Luwen,Lei, Shaochong,Zhang, Guohe,Gao, Kaile,&Liang, Bin.(2013).Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,21([db:dc_citation_issue]),614-623.
MLA	Liang, Feng,et al."Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes".IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 21.[db:dc_citation_issue](2013):614-623.

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